Surface Contamination and Cleaning Reviews

Surface Contamination and Cleaning

This volume documents the proceedings of the International Symposium on Surface Contamination and Cleaning, held in Newark, New Jersey, May 23-25, 2001. Because of the importance of this topic in many technological areas, tremendous efforts have been devoted to devise novel and more efficient ways to monitor, analyse and characterize contamination on surfaces as well as ways to remove such contamination from a wide variety of surfaces. The technological areas where surface contamination has always been a bete noire and thus surface cleaning is of cardinal importance are too many and range from aerospace to microelectronics to biomedical. This volume contains a total of 24 papers, all rigorously peer reviewed and revised before inclusion, which deal with all kinds of contaminations on a host of surfaces. The topics covered include: mapping of surface contaminants; various techniques for cleaning surfaces; various techniques for monitoring level of cleanliness; acceptable cleanliness lev

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Developments in Surface Contamination and Cleaning – Methods for Removal of Particle Contaminants

Developments in Surface Contamination and Cleaning – Methods for Removal of Particle Contaminants

Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and best practice guidance for scientists and engineers engaged in surface cleaning or handling the consequences of surface contamination.
Topics covered include:

A systems analysis approach to contamination control
Physical factors that influence the behavior of particle deposition in enclosures
An overview of current yield models and description of advanced models
Types of strippable coatings, their properties and applications of these coatings for removal of surface contaminants
In-depth coverage of ultrasonic cleaning
Contamination and cleaning issues at the nanoscale
Experimental results illustrating the impact of model parameters on the removal of particle contamination

The expert contributions in this book provide a valuable source of information on the current status and rece

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